Built-In Self Test

نویسندگان

  • Fulvio Corno
  • Maurizio Rebaudengo
  • Matteo Sonza Reorda
چکیده

BIST is a technique aimed to: Avoiding the usage of expensive ATE Increase the fault tolerance since it add more access to the internal points Allow the application of at-speed test and reduce the test time. It is mandatory to consider the BIST as a test solution when the design flow and the design area can afford it.

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Low Power March Memory Test Algorithm for Static Random Access Memories (TECHNICAL NOTE)

Memories are most important building blocks in many digital systems. As the Integrated Circuits requirements are growing, the test circuitry must grow as well. There is a need for more efficient test techniques with low power and high speed. Many Memory Built in Self-Test techniques have been proposed to test memories. Compared with combinational and sequential circuits memory testing utilizes ...

متن کامل

Embedded Memory Test Strategies and Repair

The demand of self-testing proportionally increases with memory size in System on Chip (SoC). SoC architecture normally occupies the majority of its area by memories. Due to increase in density of embedded memories, there is a need of self-testing mechanism in SoC design. Therefore, this research study focuses on this problem and introduces a smooth solution for self-testing.  In the proposed m...

متن کامل

Look up Table Based Low Power Analog Circuit Testing

In this paper, a method of low power analog testing is proposed. In spite of having Oscillation Based Built in Self-Test methodology (OBIST), a look up table based (LUT) low power testing approach has been proposed to find out the faulty circuit and also to sort out the particular fault location in the circuit. In this paper an operational amplifier, which is the basic building block in the ana...

متن کامل

Design for test boot camp, Part 4: Built-in self-test

Logic built-in self-test (LBIST), is a mechanism that lets an (IC) test the integrity of its own digital logic structures. LBIST operates by stimulating the logic-based operations of the IC and then detecting if the logic behaved as intended. The main advantage of LBIST is that it provides test capability without an external tester. In particular, safety-critical designs need to be tested and r...

متن کامل

Built-In Self-Test for the Analysis of Mixed-Signal Systems

.............................................................................................................................. ii Acknowledgements ............................................................................................................ iii List of Figures .................................................................................................................... vi L...

متن کامل

Synthesis Techniques for Pseudo-Random Built-In Self-Test

This technical report contains the text of Nur Touba's thesis "Synthesis Techniques for Pseudo-Random Built-In Self-Test." The thesis appendices have appeared as CRC Technical Reports, and are not included here.

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

ثبت نام

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

عنوان ژورنال:

دوره   شماره 

صفحات  -

تاریخ انتشار 2009